首页> 外国专利> Photodiode array detector with different charge accumulation time for each light receiving element within one unit

Photodiode array detector with different charge accumulation time for each light receiving element within one unit

机译:光电二极管阵列检测器,一个单元内的每个光接收元件具有不同的电荷累积时间

摘要

A photodiode array detector used for detecting light which has undergone wavelength separation by a spectroscopic element, the photodiode array detector including: a light receiving element array wherein, taking a plurality of light receiving elements which detect light of the same wavelength range as one unit, a plurality of such units are arrayed in the direction of dispersion of said wavelength; and a charge accumulation time setting unit which sets different charge accumulation times for the plurality of light receiving elements within the one unit.
机译:一种光电二极管阵列检测器,用于检测通过光谱元件进行了波长分离的光,该光电二极管阵列检测器包括:光接收元件阵列,其中,将检测相同波长范围的光的多个光接收元件作为一个单元,在所述波长的色散方向上排列有多个这样的单元。电荷蓄积时间设定单元,对一个单元内的多个光接收元件设定不同的电荷蓄积时间。

著录项

  • 公开/公告号US9508765B2

    专利类型

  • 公开/公告日2016-11-29

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORPORATION;

    申请/专利号US201414474391

  • 发明设计人 MICHIAKI OWA;

    申请日2014-09-02

  • 分类号H01L27/146;G01J3/28;

  • 国家 US

  • 入库时间 2022-08-21 13:41:13

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