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Radio frequency LDMOS device and a fabrication method therefor

机译:射频LDMOS器件及其制造方法

摘要

A radio frequency LDMOS device, wherein the drift region includes a first injection region and a second injection region; the first injection region situated between a second lateral surface of a polysilicon gate and a second lateral surface of a first Faraday shielding layer; the second injection region situated between the second lateral surface of the first Faraday shielding layer and the drain region and encloses the drain region; the second lateral surface of the second Faraday shielding layer is a surface of a side near the drain region, the maximum electric field strength of the drift region on the bottom of the second lateral surface of the second Faraday shielding layer is regulated via regulation of the doping concentration of the second injection region; the doping concentration of the first injection region is higher than the second injection region.
机译:一种射频LDMOS器件,其中,漂移区包括第一注入区和第二注入区。第一注入区位于多晶硅栅极的第二侧面与第一法拉第屏蔽层的第二侧面之间;第二注入区位于第一法拉第屏蔽层的第二侧面与排泄区之间,并包围排泄区。第二法拉第屏蔽层的第二侧面是靠近漏极区的一侧的表面,第二法拉第屏蔽层的第二侧面的底部上的漂移区的最大电场强度是通过调节第二注入区的掺杂浓度;第一注入区的掺杂浓度高于第二注入区。

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