首页> 外国专利> ULTRA-HIGH-SPEED, HIGH-PRECISION, THREE-DIMENSIONAL REFRACTIVE INDEX MEASUREMENT METHOD AND DEVICE USING WAVEFRONT SHAPER

ULTRA-HIGH-SPEED, HIGH-PRECISION, THREE-DIMENSIONAL REFRACTIVE INDEX MEASUREMENT METHOD AND DEVICE USING WAVEFRONT SHAPER

机译:超高速,高精度,三维折光率指数测量方法及装置

摘要

An ultra-high-speed, high-precision, three-dimensional refractive index measurement method and device using a wavefront shaper are disclosed. The ultra-high-speed, high-precision, three-dimensional refractive index measurement method using a wavefront shaper can comprise the steps of: changing the irradiation angle and/or a wavefront pattern of incident light beams so as to make the light beams incident to a sample, by using the wavefront shaper; measuring, according to at least one of the incident light beams, a two-dimensional optical field having passed through the sample, by using an interferometer; and acquiring a three-dimensional refractive index image through the information of the measured two-dimensional optical field.
机译:公开了一种使用波前成形器的超高速,高精度的三维折射率测量方法和装置。使用波前成形器的超高速,高精度的三维折射率测量方法可以包括以下步骤:改变入射光束的照射角度和/或波前图案,以使光束入射通过使用波前成形器对样本进行采样;根据所述入射光束中的至少一个,通过使用干涉仪测量已经穿过所述样品的二维光学场;通过测量的二维光场信息获取三维折射率图像。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号