首页> 外国专利> SURFACE MEASUREMENT APPARATUS AND SURFACE MEASUREMENT METHOD USING MULTIPLE LIGHT SOURCES

SURFACE MEASUREMENT APPARATUS AND SURFACE MEASUREMENT METHOD USING MULTIPLE LIGHT SOURCES

机译:使用多种光源的表面测量装置和表面测量方法

摘要

The present invention relates to a surface measurement apparatus and a surface measurement method using multiple light sources. The apparatus comprises: a light source unit including multiple light sources to selectively irradiate light to the surface of a subject; an image acquisition unit for acquiring an image by sequentially photographing the surface of a subject to which a light source has been irradiated; and a shielding unit installed around the light source unit and the image acquisition unit to block external light. Accordingly, in the present invention, a shielding unit for blocking external light is installed around the light source unit and the image acquisition unit to measure the surface, and it is thus unnecessary to separately install a blocking filter, which blocks a light source other than a light source for measurement, in a camera of the image acquisition unit. Therefore, the present invention can not only reduce the cost for installation of the camera, but can also improve the utilization, accuracy, and preciseness of an image of the camera.
机译:表面测量装置和表面测量方法技术领域本发明涉及使用多个光源的表面测量装置和表面测量方法。该设备包括:光源单元,其包括多个光源以选择性地将光照射到对象的表面;以及图像获取单元,其用于通过顺序拍摄已经照射了光源的被摄体的表面来获取图像;遮蔽单元安装在光源单元和图像获取单元周围以阻挡外部光。因此,在本发明中,在光源单元和图像获取单元的周围安装有用于遮挡外部光的遮蔽单元以测量表面,因此不需要单独安装遮挡除了光源之外的光源的遮挡滤光器。在图像获取单元的照相机中用于测量的光源。因此,本发明不仅可以降低照相机的安装成本,而且可以提高照相机的图像的利用率,准确性和准确性。

著录项

  • 公开/公告号WO2017135710A1

    专利类型

  • 公开/公告日2017-08-10

    原文格式PDF

  • 申请/专利权人 INNSYS INC.;

    申请/专利号WO2017KR01153

  • 发明设计人 PARK CHANG SIK;

    申请日2017-02-02

  • 分类号G01N21/01;G01N21/25;G01N21/33;G01N21/35;A61B5;G01N21/17;

  • 国家 WO

  • 入库时间 2022-08-21 13:30:10

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