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DROP-WEIGHT TYPE INSTRUMENTED CHARPY IMPACT TESTER

机译:落差式仪表式打击冲击试验机

摘要

The present invention relates to a drop-weight type instrumented Charpy impact tester, and more specifically, to a drop-weight type instrumented Charpy impact tester, applying an impact load to a material while freely and vertically dropping an impact rod with a sufficient length, so as to measure and evaluate bending deformation and breakage behavior of the material according to the bending deformation caused by the impact load. According to the present invention, the Charpy impact tester using a V-notch Charpy specimen comprises: a base plate, a specimen support installed in an upper part of the base plate, having a support end upwardly projected out in both upper sides, and having an anvil to support both ends of the V-notch Charpy specimen in an upper part of the support end; an electromagnet vertically lifted in an upper part of the specimen support by a lifting means; the impact rod installed in the electromagnet to apply an impact power of a three point bending load shape to the V-notch Charpy specimen while being freely dropped by loss of electromagnetic force of the electromagnet, so as to cause bending deformation in the V-notch Charpy specimen and break the V-notch Charpy specimen; and a load signal detection sensor installed in both sides of the impact rod to detect a dynamic load signal according to the bending deformation and breakage of the V-notch Charpy specimen.;COPYRIGHT KIPO 2017
机译:落锤式仪表式夏比冲击测试仪技术领域本发明涉及一种落锤式仪表式夏比冲击测试仪,更具体地,涉及一种落锤式仪表式夏比冲击测试仪,其在向材料施加冲击载荷的同时自由竖直地下落具有足够长度的冲击杆,从而根据冲击载荷引起的弯曲变形来测量和评估材料的弯曲变形和断裂行为。根据本发明,使用V形缺口夏比试样的夏比冲击试验机包括:基板;安装在基板上部的试样支架;支架端部在两个上侧向上突出。砧座,用于在支撑端的上部支撑V型缺口夏比试样的两端。通过提升装置在样本支架的上部垂直提升的电磁体;装在电磁铁中的冲击杆向V型缺口夏比试样施加三点弯曲载荷形状的冲击力,同时由于电磁铁的电磁力损失而自由落下,从而在V型缺口中引起弯曲变形夏比试样并破坏V型缺口夏比试样; COPYRIGHT KIPO 2017;在冲击杆两侧安装了一个载荷信号检测传感器,用于根据V型缺口夏比试样的弯曲变形和断裂检测动态载荷信号。

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