首页> 外国专利> MOISTURE MEASUREMENT APPARATUS FOR STRUCTURE USING TERAHERTZ PULSE LASER

MOISTURE MEASUREMENT APPARATUS FOR STRUCTURE USING TERAHERTZ PULSE LASER

机译:使用TERAHERTZ脉冲激光的结构的水分测量装置

摘要

The present invention relates to a moisture measurement apparatus for a structure using a terahertz pulse laser, which irradiates and then receives a terahertz pulse laser toward an object to be measured to measure a water content in the object to be measured through an absorption rate and a reflection rate of the terahertz pulse laser in the object to be measured. As such, the present invention is able to diagnose a leakage through the moisture content of a structure such as a house or a building as a measurement object, and obtain image data through scanning an area of the structure; thereby being capable of comparing where the moisture is relatively large through the obtained image data, identifying an origin of the leakage, and tracking a path where the leakage occurs.;COPYRIGHT KIPO 2017
机译:湿度测量装置技术领域本发明涉及一种使用太赫兹脉冲激光的结构的水分测量装置,该装置将太赫兹脉冲激光照射然后接收到待测物体,以通过吸收率和吸收率来测量待测物体中的水分。太赫兹脉冲激光在被测物体中的反射率。这样,本发明能够通过房屋或建筑物等作为测量对象的建筑物的水分来诊断泄漏,并通过扫描建筑物的区域来获得图像数据。从而可以通过获取的图像数据比较水分相对较大的位置,识别泄漏的根源并跟踪泄漏发生的路径。; COPYRIGHT KIPO 2017

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