The present invention provides a method to correct an evolved gas analysis apparatus, capable of conveniently correcting a difference of device or daily variance of detection sensitivity, and quantizing a measurement target at high accuracy. According to the present invention, in a method to correct an evolved gas analysis apparatus including a heating unit heating a sample to generate gas component, an ion source ionizing the gas component to generate ion and a mass spectrometer performing mass analysis of the ion to detect the gas component; the method comprises: (1) a step of using a reference sample including the gas component as a measurement target to correct a spectrum position of a mass spectrum acquired with respect to the gas component of the reference sample; (2) a step of calculating, from an area S of a chromatogram of the gas component of the reference sample and a reference area Ss, a sensitivity correction coefficient Cs= Ss/S when an area of the chromatogram of the gas component of an actual sample; and (3) a step of calculating, from a time t assigning a maximum peak of the chromatogram and a reference time ts, a heating correction coefficient H=t/ts to correct a heating rate of the sample inside the heating unit when the gas component of the actual sample is measured.
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机译：本发明提供一种校正析出气体分析装置的方法，该方法能够方便地校正装置的差异或检测灵敏度的日变化，并以高精度对测量目标进行量化。根据本发明，在一种校正析出气体分析装置的方法中，该方法包括：加热单元，其加热样品以产生气体成分;离子源，使该气体成分电离以产生离子;以及质谱仪，其对该离子进行质量分析以检测气体成分;该方法包括：（1）使用包括气体成分的参考样品作为测量目标的步骤，以校正所获取的质谱相对于参考样品的气体成分的光谱位置; （2）根据参考样品的气体成分的色谱图的面积S和参考面积Ss，计算当样品的气体成分的色谱图的面积为A时的灵敏度校正系数Cs ＝ Ss / S的步骤。实际样本（3）从分配色谱图的最大峰的时间t和基准时间ts算出加热校正系数H ＝ t / ts的步骤，以校正气体发生时加热单元内部的样品的加热速率。测量实际样品的成分。
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