首页> 外国专利> SiC CMP HALITE SALTS AS SILICON CARBIDE ETCHANTS FOR ENHANCING CMP MATERIAL REMOVAL RATE FOR SIC WAFER

SiC CMP HALITE SALTS AS SILICON CARBIDE ETCHANTS FOR ENHANCING CMP MATERIAL REMOVAL RATE FOR SIC WAFER

机译:SiC CMP HALITE盐作为碳化硅设备,可提高SIC晶片的CMP材料去除率

摘要

There are silicon carbide - (sic) - etching agent is described, with the general formula mxo2, wherein m is an alkali metal, x is a halogen and o is oxygen. If it with a grinding agent powder in the form of an aqueous slurry is mixed, this acts mxo2-Etching agent as a triboelectric chemical reagent, through the sic - material removal rate lies in the chemical mechanical polishing (cmp) is increased. The material removal rates, in this case, can sometimes in comparison to the slurry without halite - etchant rise by several orders of magnitude. Typical metals in the formula mxo2 are k (potassium) and na (sodium), x comprises cl (chlorine), br (bromine) and i (iodine). All the rows of mxo2-Compounds belong to the chemical family of metallhalite or ammoniumhalite. Sodium chlorite, naclo2, the simplest and most available member of the halite - family, is a typical example. The increased polishing rate can be used, for example, the throughput of cmp in the polishing of sic - substrates, to significantly increase. The polishing waste water from the cmp - process can be due to the absence of toxic heavy metal - ions in the polishing formulations with ease in the waste water - processing plants are treated.
机译:描述了碳化硅-(SiC)-蚀刻剂,其通式为mxo 2 ,其中m是碱金属,x是卤素,o是氧。如果将其与含水浆液形式的研磨剂粉末混合,则其mxo 2 -蚀刻剂作为摩擦化学试剂,通过sic-材料去除率取决于化学机械抛光(cmp)增加。在这种情况下,材料去除率有时会比没有盐的浆液高-蚀刻剂会上升几个数量级。式mxo 2 中的典型金属是k(钾)和na(钠),x包括cl(氯),br(溴)和i(碘)。 mxo 2 -化合物的所有行均属于金属卤化物或卤化铵的化学族。典型的例子是亚氯酸钠,Naclo 2 ,是最简单,最易获得的盐岩-族成员。可以使用提高的抛光速率,例如在SiC衬底的抛光中提高cmp的产量。来自cmp工艺的抛光废水可能归因于抛光配方中不存在有毒重金属离子,废水很容易处理。

著录项

  • 公开/公告号KR20170065437A

    专利类型

  • 公开/公告日2017-06-13

    原文格式PDF

  • 申请/专利权人 FANG TRELIANT;

    申请/专利号KR20160154015

  • 发明设计人 팡 트레리안트;

    申请日2016-11-18

  • 分类号C09K13/08;C09K13/04;

  • 国家 KR

  • 入库时间 2022-08-21 13:27:18

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