首页> 外国专利> INSPECTION DEVICE FOR SPATIAL LIGHT MODULATOR ILLUMINATING OPTICAL SYSTEM EXPOSURE DEVICE INSPECTING METHOD METHOD FOR ADJUSTING ILLUMINATING OPTICAL SYSTEM ILLUMINATING METHOD EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD

INSPECTION DEVICE FOR SPATIAL LIGHT MODULATOR ILLUMINATING OPTICAL SYSTEM EXPOSURE DEVICE INSPECTING METHOD METHOD FOR ADJUSTING ILLUMINATING OPTICAL SYSTEM ILLUMINATING METHOD EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD

机译:空间光调制器照明光学系统曝光装置的检查装置调整照明光学系统照明方法的曝光方法和装置制造方法

摘要

For example, the reflectance of the mirror element of the spatial light modulator disposed in the optical path of the illumination optical system. An inspection apparatus (10) for inspecting a spatial light modulator having a plurality of individually controlled optical elements arranged in two dimensions. A conjugate optical system (11, 12) arranged on the optically downstream side of the spatial light modulator and forming an optically conjugate conjugate plane with an arrangement plane in which a plurality of optical elements are arranged, And an inspection section 14 for inspecting the optical characteristics of the plurality of optical elements based on the detection results of the optical detectors.
机译:例如,布置在照明光学系统的光路上的空间光调制器的镜元件的反射率。一种检查设备(10),用于检查具有以二维方式布置的多个单独控制的光学元件的空间光调制器。共轭光学系统(11、12),其配置在空间光调制器的光学下游侧,与配置有多个光学元件的配置面形成光共轭共轭面;以及检查部14,其对光学元件进行检查。基于光学检测器的检测结果的多个光学元件的特性。

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