REAL-TIME VARIABLE VOLTAGE CONTROL APPARATUS SEMICONDUCTOR DEVICE TEST SYSTEM USING THE SAME AND OPERATING METHOD THEREOF

摘要

The real-time voltage variable control device and the semiconductor device testing device according to an embodiment of the present invention may be configured such that the test pattern generator and the voltage variable device are combined with the test pattern to synchronize with the test pattern, And it is also possible to adjust the rising or falling speed when the supply voltage is variable.