PROBE atomic force microscope with a programmable spectral portraits radiating elements based on quantum dots core-shell structure

摘要

The invention relates to measuring equipment and can be used in scanning probe microscopy and atomic force microscopy for the diagnosis and study of nanostructures. Summary of the utility model is that the cantilever is coupled to the probe tip, the vertex of which is fixed in a conical nanopore polymer spheres containing uniformly distributed over its surface an ordered array of different diameter conical nanopores filled corresponding quantum dots with a variety of discrete spectra of light and radiationless spheres, with a combination of combinations whose diameters programmed general spectral radiation portrait. The technical result is the possibility of simultaneous coupling of the electromagnetic spectrum multivolnovogo programmable radiation exposure monitoring the mechanical response to this stimulus in a common point on the surface diagnosis object without affecting adjacent portions. 4 yl.