Measuring errors - correction method, quality test method for electronic components and characteristic - measuring system of electronic components

摘要

Measuring error correction method for correcting of measured values which, by measurement of electrical characteristics of an electronic targeting moiety (11a) from the not - coaxially type by means of an actual measuring system (2) were obtained, which is a network analyzer (3b) and a measuring holder (5b) with coaxial initially - / output terminals for connection to the network analyzer (3b) and not - coaxial initially - / output terminals for connection with electronic components from the not - coaxial type, wherein the measuring error correction method comprises the steps of:Providing a correction data detection sample (11b) in advance, the same electrical characteristics such as the electronic targeting moiety (11a) comprises;Measuring electrical characteristics of the correction data detection sample (11b) by means of a reference measurement system (1) and the actual measuring system (2);Creating a intermetallic relation formula between results which, by the reference measurement system (1) are measured, and results which, by means of the actual measuring system (2) are measured, on the basis of the measured results of the reference measurement system (1) and of the actual measuring system (2); andCorrecting the measured values to the corrected values, in that the measured values for the purpose of a calculation in the interference relation formula are used.