Inspection device and method for verifying a chip card semi-finished product

摘要

The invention relates to an inspection device (100) for verifying a semifinished product (101) for producing a chip card having a cutout bounded by a laser cutting edge (103a) for receiving an electronic circuit (104) comprising: an illumination source (105) which is formed Illuminate semifinished product (101) with light of a predetermined wavelength; an image camera (107), which is designed to capture an image recording of the illuminated semi-finished product (101) with the cut-out delimited by the laser cutting edge (103a); and a processor (109), which is designed to detect in the acquired image recording a circumferential region having a light intensity which is greater than a light intensity of an area outside the circumferential region in the acquired image recording in order to control the course of the laser cutting edge (103a). to determine and to verify the semifinished product (101) on the basis of the course of the laser cutting edge (103a).