首页> 外国专利> Method for optimizing an order of two or more measurement protocols for at least one magnetic resonance examination and a magnetic resonance apparatus for this purpose

Method for optimizing an order of two or more measurement protocols for at least one magnetic resonance examination and a magnetic resonance apparatus for this purpose

机译:用于优化至少一个磁共振检查的两个或多个测量协议的顺序的方法和为此目的的磁共振设备

摘要

The invention relates to a method for optimizing an order of two or more measurement protocols for at least one magnetic resonance examination, wherein the magnetic resonance examination is performed by means of a magnetic resonance apparatus, comprising the following steps: registering patient data of at least one patient, wherein the registration of the patient data comprises selecting two or more different measurements, each comprising at least one measurement protocol comprising at least one magnetic resonance examination, determining an optimized order of the two or more measurement protocols of the two or more different measurements of the at least one magnetic resonance examination, wherein the determination of the optimized sequence is performed by means of a protocol optimization unit Representation of the optimized sequence of the two or more measurement protocols by means of a display unit of the magnetic resonance apparatus.
机译:本发明涉及一种用于优化至少一个磁共振检查的两个或更多个测量协议的顺序的方法,其中,借助于磁共振设备执行磁共振检查,该磁共振检查包括以下步骤:登记至少一个患者的数据一名患者,其中患者数据的注册包括选择两个或多个不同的测量值,每个测量值包括至少一个测量协议,该测量协议包括至少一个磁共振检查,确定两个或多个不同测量值的两个或多个测量协议的优化顺序至少一个磁共振检查的测量值,其中,优化序列的确定借助于协议优化单元来执行。借助于磁共振设备的显示单元来表示两个或多个测量协议的优化序列。

著录项

  • 公开/公告号DE102015213595A1

    专利类型

  • 公开/公告日2017-01-26

    原文格式PDF

  • 申请/专利权人 SIEMENS HEALTHCARE GMBH;

    申请/专利号DE201510213595

  • 发明设计人 DAVID GRODZKI;

    申请日2015-07-20

  • 分类号A61B5/055;G01R33/54;

  • 国家 DE

  • 入库时间 2022-08-21 13:22:44

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