首页> 外国专利> METHOD FOR CORRECTING MEASUREMENT ERROR RESULTING FROM MEASUREMENT DEVICE TEMPERATURE DISPLACEMENT AND MASS SPECTROMETER USING SAID METHOD

METHOD FOR CORRECTING MEASUREMENT ERROR RESULTING FROM MEASUREMENT DEVICE TEMPERATURE DISPLACEMENT AND MASS SPECTROMETER USING SAID METHOD

机译:校正方法校正测量设备温度位移和质谱仪引起的测量误差的方法

摘要

A reference member (5) shaped like a columnar rod and made of a material whose coefficient of thermal expansion is different from that of a flight tube (2) is placed in contact with the tube (2). One end of the tube (2) and one end of the reference member (5) are fixed to each other with a fixture part (6). A distance measurement sensor (7) measures the difference in length between the tube (2) and the reference member (5) whose lengths fluctuate due to a change in temperature. A displacement of the difference in length, as expressed by a proportion, is larger than that of the length of the flight tube (2). The difference in length is far smaller than the length of the flight tube (2). Accordingly, the displacement due to the thermal expansion can be accurately detected even with a strain gauge or similar inexpensive sensor. The m/z values in mass spectrum data are corrected based on the measured values of the displacement, whereby a highly accurate mass discrepancy correction can be achieved.
机译:基准部件(5)形状类似于圆柱杆并且由热膨胀系数不同于飞行管(2)的材料制成,并与管(2)接触。管(2)的一端和基准构件(5)的一端通过固定部(6)固定。距离测量传感器(7)测量管(2)与基准构件(5)之间的长度差,该基准构件的长度由于温度变化而波动。长度差异的位移(以比例表示)大于飞管(2)长度的位移。长度差远小于飞行管(2)的长度。因此,即使使用应变仪或类似的廉价传感器,也可以准确地检测到由于热膨胀引起的位移。根据位移的测量值校正质谱数据中的m / z值,从而可以实现高精度的质量差异校正。

著录项

  • 公开/公告号EP3388826A1

    专利类型

  • 公开/公告日2018-10-17

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORPORATION;

    申请/专利号EP20150906266

  • 发明设计人 YAMAGUCHI SHINICHI;

    申请日2015-10-16

  • 分类号G01N27/62;H01J49/40;

  • 国家 EP

  • 入库时间 2022-08-21 13:17:37

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