首页> 外国专利> CATHODOLUMINESCENCE DETECTOR FOR USE IN A CHARGED PARTICLE MICROSCOPE

CATHODOLUMINESCENCE DETECTOR FOR USE IN A CHARGED PARTICLE MICROSCOPE

机译:用于带电粒子显微镜的阴极发光检测器

摘要

A charged particle microscope having a vacuum chamber comprising:- A sample holder, for holding a sample;- A source, for producing a probing beam of charged particles;- An illuminator, for directing said beam along an axis so as to irradiate the sample, also comprising:- A detector, for simultaneous detection of multiple wavelengths in a polychromatic flux of photonic radiation emanating from the sample in response to said irradiation,which detector comprises:- A plurality of photosensitive surfaces, each of which produces an output signal in response to detected photonic radiation; and- A plurality of optical filters, with mutually differing transmission characteristics, each associated with a respective one of said photosensitive surfaces and serving to filter photonic radiation falling thereon.
机译:具有真空室的带电粒子显微镜,包括:-样品架,用于容纳样品;-用于产生带电粒子探测束的光源;-照明器,用于沿轴线引导所述光束以照射样品,还包括:-检测器,用于同时检测响应于所述辐射而从样品发出的光子辐射的多色通量中的多个波长,哪个探测器包括:-多个光敏表面,每个光敏表面响应于检测到的光子辐射而产生输出信号;和-具有相互不同的透射特性的多个滤光器,每个滤光器与所述光敏表面中的相应一个相关联,并且用于滤光落在其上的光子辐射。

著录项

  • 公开/公告号EP3255650A1

    专利类型

  • 公开/公告日2017-12-13

    原文格式PDF

  • 申请/专利权人 FEI COMPANY;

    申请/专利号EP20160173566

  • 发明设计人 WANDROL PETR;HLAVENKA PETR;UNCOVSKY MAREK;

    申请日2016-06-08

  • 分类号H01J37/22;

  • 国家 EP

  • 入库时间 2022-08-21 13:16:35

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号