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TESTING HEAD WITH VERTICAL PROBES HAVING AN IMPROVED SLIDING MOVEMENT WITHIN RESPECTIVE GUIDE HOLES AND CORRECT HOLDING OF THE PROBES WITHIN THE TESTING HEAD UNDER DIFFERENT OPERATIVE CONDITIONS
TESTING HEAD WITH VERTICAL PROBES HAVING AN IMPROVED SLIDING MOVEMENT WITHIN RESPECTIVE GUIDE HOLES AND CORRECT HOLDING OF THE PROBES WITHIN THE TESTING HEAD UNDER DIFFERENT OPERATIVE CONDITIONS
A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.
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