TESTING HEAD WITH VERTICAL PROBES HAVING AN IMPROVED SLIDING MOVEMENT WITHIN RESPECTIVE GUIDE HOLES AND CORRECT HOLDING OF THE PROBES WITHIN THE TESTING HEAD UNDER DIFFERENT OPERATIVE CONDITIONS

摘要

A testing head (20) with vertical probes for the functionality testing of a device under test (28), the testing head (20) comprising at least one couple of plate-like supports (22, 23) separated from each other by a suitable gap (29) and provided with respective guide holes (24; 25A, 25B) in order to slidably house a plurality of contact probes (21), each contact probe (21) comprising a rod-like body (21') extending along a preset longitudinal axis (HH) between a first and a second end (26, 27), the first end being a contact tip (26) adapted to abut onto a contact pad (28A) of the device under test (28) and the second end being a contact head (27) adapted to abut onto a contact pad (31A) of a space transformer (31). Suitably, at least one of the supports (23) comprises at least one couple of guides (23A, 23B) that are parallel to each other and separated by an additional gap (29') and provided with corresponding guide holes (25A, 25B). Additionally, each contact probe (21) comprises at least one protruding element or stopper (30) protruding from one of its lateral walls (32d, 32s), those lateral walls (32d, 32s) contacting one wall (35d, 35s, 36d, 36s) of at least one of the guide holes (25A, 25B) of the guides (23A, 23B).