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RELATION IDENTIFYING METHOD, RELATION IDENTIFYING DEVICE, RELATION IDENTIFYING PROGRAM, CORRECTION METHOD, CORRECTION DEVICE, AND CORRECTION PROGRAM

机译:关系标识方法,关系标识设备,关系标识程序,校正方法,校正设备和校正程序

摘要

PROBLEM TO BE SOLVED: To allow an interference waveform to be corrected.;SOLUTION: A computer 2 obtains interference waveforms corresponding to respective inclination angles in the case of changing an inclination angle, i.e. an angle of a work W placed on a three-dimensional measuring device 1 to an optical path of white light radiated by a white interferometer 12 at the three-dimensional measuring device 1 including the white interferometer 12, identifies a plurality of phase offsets between each of the plurality of interference waveforms obtained at the plurality of inclination angles and a reference interference waveform, and identifies relation between the inclination angle and the phase offset on the basis of the inclination angles and the phase offsets.;SELECTED DRAWING: Figure 5;COPYRIGHT: (C)2019,JPO&INPIT
机译:解决的问题:为了校正干扰波形。解决方案:计算机2在改变倾斜角(即,放置在三维上的工件W的角度)的情况下获得与各个倾斜角相对应的干扰波形。测量装置1对由包括白色干涉仪12的三维测量装置1处的白色干涉仪12辐射的白光的光路进行识别,以多个倾斜度获得的多个干涉波形中的每一个之间的多个相位偏移角度和参考干扰波形,并根据倾斜角度和相位偏移确定倾斜角度和相位偏移之间的关系。;选定的图纸:图5;版权:(C)2019,JPO&INPIT

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