首页> 外国专利> PHYSICAL THICKNESS ESTIMATION PROGRAM AND REFRACTION INDEX DATA ESTIMATION PROGRAM, PHYSICAL THICKNESS DATA ESTIMATION SYSTEM AND REFRACTION INDEX DATA ESTIMATION SYSTEM

PHYSICAL THICKNESS ESTIMATION PROGRAM AND REFRACTION INDEX DATA ESTIMATION PROGRAM, PHYSICAL THICKNESS DATA ESTIMATION SYSTEM AND REFRACTION INDEX DATA ESTIMATION SYSTEM

机译:物理厚度估计程序和折射指数数据估计程序,物理厚度数据估计系统和折射指数数据估计系统

摘要

PROBLEM TO BE SOLVED: To provide a physical thickness estimation program capable of estimating physical thickness data and a physical thickness data estimation system using the same, a refraction index data estimation program using the same and a refraction index data estimation system.;SOLUTION: Disclosed refraction index data estimation program causes a computer to execute the steps of: calculating physical thickness data of a measuring object based on a piece of hologram image data; calculating phase difference data of the measuring object based on the hologram image data; and calculating refraction index data of the measuring object based on the physical thickness data and the phase difference data.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:提供一种能够估算物理厚度数据的物理厚度估算程序和使用该估算程序的物理厚度数据估算系统,使用该估算程序的折射率数据估算程序和折射率数据估算系统。折射率数据估计程序使计算机执行以下步骤:基于一张全息图像数据计算测量对象的物理厚度数据;以及根据全息图像数据计算出被测物的相位差数据;物理厚度数据和相差数据,计算出被测物的折射率数据。选图:图1;版权:(C)2018,日本特许厅&INPIT

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