Matching method of feature points of planar array of 4 camera pairs and measurement method based thereon

摘要

To reduce the complexity of the matching method and the measuring method, simplify the calculation process of the space size, and reduce the measurement error of the system.A method of matching feature points of a planar array of four camera sets and a method of measuring based on feature points matching planar arrays of four camera groups belong to the field of optoelectronic measurement. The matching method uses one image plane of the four image planes as the base image plane and one feature point of the base image plane in the lateral direction in the image plane adjacent to the base image plane and the feature point Searching all the matching points to be matched, searching for all the matching points matching with the feature point in the image plane adjacent to the base image plane in the longitudinal direction with respect to the feature point in the base image plane, Matching all the matching points in the two transverse and longitudinal directions to find all the sub matching point pairs; and searching all the feature points of the base image plane and all the found sub matching point pairs in the diagonal position image plane Searching for a matching point corresponding to the same point of view in the four image planes; And a step of determining. For each uniqueness matching point set, three-dimensional space coordinates of the viewpoint are calculated based on the image coordinates of the matching point set and the parameters of the camera system itself. In any of the light irradiation conditions, if the collected image is sufficiently sharp and it is possible to form an image with the image of the planar array of any four camera groups, and there is a viewing object having certain image characteristics , It is possible to realize all three-dimensional measurement of the object to be observed by exactly the same matching method and measurement method.(FIG.