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MICROSCOPIC RAMAN SPECTROMETER AND RAMAN MICROSPECTROSCOPIC SYSTEM

机译:显微拉曼光谱仪和显微拉曼光谱系统

摘要

PROBLEM TO BE SOLVED: To provide a microscopic Raman spectrometer and a Raman microspectroscopic system which can perform position detection of a minute sample equal to or smaller than the wavelength of Raman exciting light and Raman measurement.SOLUTION: A microscopic Raman optical system 100 includes: an oblique irradiation optical system 130 irradiating a minute sample 10 with a laser beam for detecting a position of the minute sample 10 on a principal surface of a semiconductor wafer; and a vertical irradiation optical system irradiating the minute sample 10 with a laser beam for exciting Raman scattered light. The laser beam for detecting a position of the minute sample 10 is emitted to the minute sample 10 from an oblique direction with respect to the principal surface of the semiconductor wafer, and the laser beam for exciting the Raman scattered light is emitted to the minute sample 10 from an orthogonal direction with respect to the principal surface of the semiconductor wafer. The position of the minute sample 10 is recognized by a dark field microscopic image.SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种显微拉曼光谱仪和拉曼显微光谱系统,其能够执行等于或小于拉曼激发光的波长的微小样品的位置检测和拉曼测量。解决方案:显微拉曼光学系统100包括:斜照射光学系统130向微小样品10照射激光,以检测微小样品10在半导体晶片的主面上的位置。垂直照射光学系统向微小样品10照射激光以激发拉曼散射光。用于检测微小样品10的位置的激光束从相对于半导体晶片的主表面倾斜的方向发射到微小样品10,并且用于激发拉曼散射光的激光束发射到微小样品。从相对于半导体晶片的主表面正交的方向看图10。微小样品10的位置可通过暗场显微图像识别。选图:图1

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