Apparatus and method for measuring load current by applying a compensated gain to a voltage derived from a drain-source voltage of a power gating device

摘要

An apparatus and method for measuring load current supplied to one or more integrated circuit cores is disclosed. The device includes a power gating field effect transistor (FET) comprising a gate, a source, and a drain, wherein the source is coupled to a voltage rail, the drain is coupled to a load, and the gate is coupled to a voltage rail. Gain based on the drain-source voltage of the power gating FET configured to receive a gating voltage to selectively turn on the power gating FET to allow flow between the load A differential amplifier configured to generate a current-related voltage with respect to a load current by applying to the input voltage, wherein the gain is input in response to a voltage or temperature change of the gate-source voltage of the power gating FET Change in inverse proportion to the voltage. [Selection] Figure 2