THREE-DIMENSIONAL REFRACTIVE INDEX TOMOGRAPHY AND FLUORESCENCE STRUCTURED ILLUMINATION MICROSCOPY SYSTEM USING WAVEFRONT SHAPER, AND METHOD OF USING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide an ultra-high-speed 3D refractive index tomography and fluorescence structured illumination microscopy system using a wavefront shaper, and a method of using the same.SOLUTION: A method of using an ultra-high-speed 3D refractive index tomography and fluorescence structured illumination microscopy system that utilizes a wavefront shaper includes steps of; adjusting an irradiation angle of a plane wave incident to a sample using the wavefront shaper; measuring a two-dimensional optical field passing through the sample based on the irradiation angle of the plane wave; and obtaining a 3D refractive index image from information on the measured two-dimensional optical field using an optical diffraction tomography or a filtered back projection algorithm.SELECTED DRAWING: Figure 1