首页> 外国专利> Melt gap measurement apparatus, crystal growth apparatus, and melt gap measurement method

Melt gap measurement apparatus, crystal growth apparatus, and melt gap measurement method

机译:熔间隙测量装置,晶体生长装置和熔间隙测量方法

摘要

A melt gap measuring apparatus is adapted to measure the gap between the bottom of the heat insulating cover and the surface of the raw material melt inside a crucible. The melt gap measuring apparatus includes a first light-guiding probe having a first upper side and a first bottom side which are opposite to each other. The first upper side is exposed to an inner wall of the heat insulating cover, and the first bottom side protrudes from the bottom side of the heat insulating cover. An image capturing device is disposed above the heat insulating cover to capture the image of the first upper side. Moreover, a crystal growth apparatus and a method of measuring the melt gap are also provided.
机译:熔体间隙测量装置适于测量绝热盖的底部与坩埚内部的原料熔体表面之间的间隙。熔体间隙测量设备包括具有彼此相对的第一上侧和第一底侧的第一导光探针。第一上侧暴露于绝热罩的内壁,并且第一底侧从绝热罩的底侧突出。图像捕获装置布置在隔热盖上方以捕获第一上侧的图像。此外,还提供了晶体生长设备和测量熔体间隙的方法。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号