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Calibration device for microwave analysis equipment or microwave measurement equipment

机译:微波分析设备或微波测量设备的校准装置

摘要

The present invention relates to a calibration apparatus 100 for the calibration of analytical or measuring instruments such as vector network analyzers. The calibration apparatus includes a plurality of calibrator connector elements 20A, 20B that allow the instrument to be connected and a plate element 10 that includes a plurality of calibration waveguide structures 111-115 and a conductive surface 12, each calibrator connector element. And / or the conductive surface of the plate element has a periodic structure 27 between which the gap 29 is formed to form a waveguide line interface and to be coupled to the waveguide of the device Each calibrator connector element 20A, 20B, including a waveguide 23 connected to 33, can be interconnected with a calibration waveguide structure (111-115. The calibration device comprises a plate element and / or each calibrator. Control functions 14 and drives that controllably move the connector elements and allow connection of each calibrator connector element 20A, 20B to a different calibration waveguide structure 111-115 Further comprising a stage 13. INVENTION 1.
机译:本发明涉及用于对诸如矢量网络分析仪之类的分析或测量仪器进行校准的校准设备100。校准设备包括允许仪器连接的多个校准器连接器元件20A,20B以及包括多个校准波导结构111-115和导电表面12的板元件10,每个校准器连接器元件。和/或板元件的导电表面具有周期性结构27,在间隙29之间形成间隙29以形成波导线界面并耦合到装置的波导。每个校准器连接器元件20A,20B,包括波导23。连接到33的传感器可以与校准波导结构(111-115。互连。校准设备包括一个板状元件和/或每个校准器。控制功能14和驱动器可控地移动连接器元件并允许每个校准器连接器元件20A连接,20B,20B至另一校准波导结构111-115,还包括平台13。发明1。

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