首页> 外国专利> MEASURING INSTRUMENT FOR MEASURING CAPACITY, AND METHOD FOR CALIBRATING TRANSPORT POSITION DATA IN PROCESSING SYSTEM BY USING MEASURING INSTRUMENT

MEASURING INSTRUMENT FOR MEASURING CAPACITY, AND METHOD FOR CALIBRATING TRANSPORT POSITION DATA IN PROCESSING SYSTEM BY USING MEASURING INSTRUMENT

机译:用于测量能力的测量仪器以及使用该测量仪器校准处理系统中的运输位置数据的方法

摘要

PROBLEM TO BE SOLVED: To understand positional relationship of a focus ring and a measuring instrument.SOLUTION: A measuring instrument for measuring capacity is provided. The measuring instrument includes a base substrate having disk shape, multiple first sensors providing, respectively, with multiple side electrodes arranged along the edge of the base substrate, one or more second sensors each having a bottom electrode provided along the bottom face of the base substrate, and a circuit board. The circuit board is configured to give a high frequency signal to the multiple side electrodes and bottom electrode, to generate multiple first measured values representing a capacity from the respective voltage amplitudes in the multiple side electrodes, and to generate a second measured values representing a capacity from the voltage amplitude in the bottom electrode.SELECTED DRAWING: Figure 5
机译:解决的问题:了解聚焦环和测量仪器的位置关系。解决方案:提供了一种用于测量容量的测量仪器。该测量仪器包括:呈盘状的基底;多个第一传感器,分别沿基底的边缘设置有多个侧电极;一个或多个第二传感器,每个第二传感器具有沿基底的底面设置的底部电极。 ,以及电路板。电路板被配置为将高频信号提供给多个侧电极和底部电极,以从多个侧电极中的各个电压幅度生成表示电容的多个第一测量值,并生成表示电容的第二测量值。底部电极的电压幅值。选定的图:图5

著录项

  • 公开/公告号JP2017228754A

    专利类型

  • 公开/公告日2017-12-28

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LTD;

    申请/专利号JP20160207649

  • 发明设计人 SUGITA KIPPEI;MINAMI TOMOHIDE;

    申请日2016-10-24

  • 分类号H01L21/68;G01B7;

  • 国家 JP

  • 入库时间 2022-08-21 13:09:23

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