首页> 外国专利> Appearance inspection method for flat wire enameled wire and appearance inspection apparatus for flat angle enameled wire

Appearance inspection method for flat wire enameled wire and appearance inspection apparatus for flat angle enameled wire

机译:扁线漆包线的外观检查方法及扁角漆包线的外观检查装置

摘要

PROBLEM TO BE SOLVED: To provide an appearance inspection method of flat enameled wire and a visual inspection apparatus of flat enameled wire capable of accurately detecting defects on the surface of a flat enameled wire.SOLUTION: The visual inspection apparatus picks up a bright field image of a flat surface and an angle face while irradiating the flat surface and the angle face of the flat enameled wire moving in a longitudinal direction with a bright-field imaging beam. The visual inspection apparatus also picks up a dark field image of the flat surface and the angle face while irradiating the flat enameled wire with a dark-field imaging beam along the longitudinal direction. The visual inspection apparatus determines existence/absence of defects on the flat surface and the angle face based on the bright field image and the dark field image.SELECTED DRAWING: Figure 2
机译:解决的问题:提供一种扁平漆包线的外观检查方法和一种扁平漆包线的外观检查装置,其能够准确地检测扁平漆包线表面上的缺陷。解决方案:外观检查装置拾取亮场图像在用长场成像光束照射沿纵向移动的扁平漆包线的平面和斜面的同时,对平面和斜面的角度进行测量。目视检查装置还沿水平方向用暗场成像束照射扁平漆包线,同时拾取平面和斜面的暗场图像。目视检查设备根据明场图像和暗场图像确定平面和斜面上是否存在缺陷。选定的图:图2

著录项

  • 公开/公告号JP6278274B2

    专利类型

  • 公开/公告日2018-02-14

    原文格式PDF

  • 申请/专利权人 日立金属株式会社;

    申请/专利号JP20140241461

  • 发明设计人 冨田 雄二朗;伏木 厳穣;

    申请日2014-11-28

  • 分类号G01N21/892;

  • 国家 JP

  • 入库时间 2022-08-21 13:08:26

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