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Machine learning device, life prediction device, numerical control device, production system, and machine learning method for predicting life of NAND flash memory
Machine learning device, life prediction device, numerical control device, production system, and machine learning method for predicting life of NAND flash memory
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机译:用于预测NAND闪存的寿命的机器学习装置,寿命预测装置,数控装置,生产系统和机器学习方法
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摘要
A machine learning apparatus which learns the predicted life of a NAND flash memory provided in a numerical control device includes a state observation unit which observes state variables obtained based on at least one of the rewrite count, the rewrite interval, the read count, the temperature in the use environment, the error rate, information concerning the manufacturer, and information concerning the manufacturing lot for the NAND flash memory, and information concerning the ECC (Error Correction Coding) performance, information concerning the manufacturer, and information concerning the manufacturing lot for a memory controller which performs ECC processing for the NAND flash memory, and a learning unit which learns the predicted life of the NAND flash memory based on teacher data, and training data generated from the output of the state observation unit and data associated with the life of the NAND flash memory.
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