Runway lamp inspection device and runway lamp inspection method

摘要

Provided is an inspection device for a runway illumination lamp that requires a minimum amount of data and can determine whether there is an abnormality in the illumination lamp in a short time. The illumination lamp detection means (11), the image acquisition means (12), and the determination means (13) are included, and the illumination lamp detection means (11) includes the illumination lamp (21) embedded in the runway (20). And the image acquisition means (12) acquires the image of the illumination lamp (21) when the illumination lamp detection means (11) detects the illumination lamp (21), and the determination means (13) A runway illuminating lamp inspection apparatus, wherein the presence or absence of abnormality of the illuminating lamp (21) is determined from the acquired image of (21).