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Method of designing double incident slit spectrometer and double entrance slit spectrometer

机译:双入射狭缝光谱仪的设计方法及双入射狭缝光谱仪

摘要

A method for designing a double-entrance slit spectrograph and a double-entrance slit spectrograph. A concave grating (G), two entrance slits (A1, A2) and two optical detectors (B1B2, B1'B2') are used to construct the spectrograph. The method comprises the following steps: 1) determining an incidence angle of the first entrance slit and a groove profile period of the concave grating; 2) estimating a blaze angle of the concave grating, and determining a surface material and a groove profile structure of the concave grating; 3) estimating the range of the incidence angle, and acquiring a wavelength-diffraction efficiency curve of the concave grating under multiple angles distributed within the range of the incidence angle when the incidence angle is θA1; 4) determining the value of an incidence angle θA2, the value of a wavelength λ2 and the value of a wavelength λ3; 5) obtaining a recording structure parameter and a using structure parameter; 6) determining the making parameter of the concave grating; and 7) determining the positions of the two entrance slits and the two optical detectors with respect to the concave grating, so as to obtain the spectrograph via construction. The spectrograph obtained by this design method can improve the diffraction efficiency in most of the spectrum areas.
机译:设计双入口狭缝光谱仪和双入口狭缝光谱仪的方法。使用凹面光栅(G),两个入射狭缝(A1,A2)和两个光学检测器(B1B2,B1'B2')来构成光谱仪。该方法包括以下步骤:1)确定第一入射缝的入射角和凹面光栅的凹槽轮廓周期; 2)估计凹面光栅的闪耀角,确定凹面光栅的表面材料和凹槽轮廓结构; 3)估计入射角的范围,获取入射角为θA1时,在入射角范围内分布的多个角度下的凹面光栅的波长衍射效率曲线; 4)确定入射角θA2的值,波长λ2的值和波长λ3的值; 5)获取记录结构参数和使用结构参数; 6)确定凹面光栅的制作参数; 7)确定两个入射狭缝和两个光学检测器相对于凹面光栅的位置,以便通过构造获得光谱仪。通过这种设计方法获得的光谱仪可以提高大多数光谱区域的衍射效率。

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