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SiC semiconductor device having a high mobility and a high threshold voltage, inverter circuit, and vehicle

机译:具有高迁移率和高阈值电压的SiC半导体器件,逆变器电路和车辆

摘要

A semiconductor device including a p-type SiC layer, a gate electrode, and a gate insulating layer therebetween, the gate insulating layer including a first layer, a second layer provided between the first layer and the gate electrode and having a higher oxygen density than the first layer, a first and second regions provided in the second layer, the first region including a first element (at least one of Ta, Nb and V) having a first concentration peak, and the second region including a second element (at least one of Ge, B, Al, Ga, In, Be, Mg, Ca, Sr, Ba , La, and lanthanoid) having a second concentration peak of the second element and a third concentration peak of C, a distance between the second concentration peak and the third concentration peak being shorter than a distance between the first concentration peak and the third concentration peak.
机译:一种半导体器件,包括p型SiC层,栅电极和位于它们之间的栅绝缘层,该栅绝缘层包括第一层,第二层,该第二层设置在第一层和栅电极之间并且氧密度高于第一层,设置在第二层中的第一和第二区域,第一区域包括具有第一浓度峰值的第一元素(Ta,Nb和V中的至少一个),第二区域包括第二元素(至少Ge,B,Al,Ga,In,Be,Mg,Ca,Sr,Ba,La和镧系元素之一)具有第二元素的第二浓度峰和C的第三浓度峰(第二浓度之间的距离)峰值和第三浓度峰值比第一浓度峰值和第三浓度峰值之间的距离短。

著录项

  • 公开/公告号US10026813B2

    专利类型

  • 公开/公告日2018-07-17

    原文格式PDF

  • 申请/专利权人 KABUSHIKI KAISHA TOSHIBA;

    申请/专利号US201715634116

  • 发明设计人 TATSUO SHIMIZU;RYOSUKE IIJIMA;

    申请日2017-06-27

  • 分类号H01L29/15;H01L29/16;H01L29/51;H01L29/78;

  • 国家 US

  • 入库时间 2022-08-21 13:05:40

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