X-RAY PHASE-CONTRAST AND DARK-FIELD INFORMATION EXTRACTION WITH ELECTRIC FRINGE SCANNING AND/OR ACTIVE PIXEL PROCESSING

摘要

Novel and advantageous systems and methods for performing X-ray imaging by extracting X-ray phase-shift and/or dark-field information through a detector that has built-in G2 functionality are provided. Grating translation can be replaced by an electrical operation in the detection procedure, thereby eliminating the need for the analyzer grating and the typical mechanical stepping process.