IMPLEMENTING INTEGRATED CIRCUIT YIELD ENHANCEMENT THROUGH ARRAY FAULT DETECTION AND CORRECTION USING COMBINED ABIST, LBIST, AND REPAIR TECHNIQUES

摘要

A method and system are provided for implementing integrated circuit yield enhancement through array fault detection and correction using combined Logic Built in Self Test (LBIST) diagnostics, and Array Built in Self-Test (ABIST) repair techniques to identify failures in the random logic feeding to and from array and array cell fails. The combination of running LBIST along with the arrays while also implementing a method of recording the array related LBIST fails for inclusion into a repair algorithm using the redundant array structures enables integrated circuit yield enhancement.