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COMPENSATED READOUT OF A MEMRISTOR ARRAY, A MEMRISTOR ARRAY READOUT CIRCUIT, AND METHOD OF FABRICATION THEREOF

机译:存储器阵列的补偿读出,存储器阵列读出电路及其制造方法

摘要

A method for readout of a gated memristor array, a memristor array readout circuit and method of fabrication thereof are provided. In the context of the method, the method includes selecting a row of a memristor array associated with a desired cell, measuring the value of the selected memristor row, and selecting a column of a memristor array associated with the desired cell. The selection of the column and selection of the row selects the desired cell. The method also includes measuring the value of the memristor selected row with the selected desired cell and determining the value of the desired cell based on the value of the selected memristor row and the value of the selected memristor row with the selected desired cell.
机译:提供了一种用于读出门控忆阻器阵列的方法,忆阻器阵列读出电路及其制造方法。在该方法的上下文中,该方法包括:选择与期望的单元相关联的忆阻器阵列的行;测量所选择的忆阻器行的值;以及选择与期望的单元相关联的忆阻器阵列的列。选择列和选择行将选择所需的单元格。该方法还包括测量具有所选期望单元的忆阻器所选行的值,以及基于所选忆阻器行的值和具有所选期望单元的所选忆阻器行的值来确定所需单元的值。

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