首页> 外国专利> DEBRIS DIRECT REFLECTION EMBEDDED MICROSCOPE FOR ON-LINE VISUAL FERROGRAPH

DEBRIS DIRECT REFLECTION EMBEDDED MICROSCOPE FOR ON-LINE VISUAL FERROGRAPH

机译:在线视觉铁谱的DEBRIS直接反射嵌入式显微镜

摘要

A debris direct reflection embedded microscope comprises a focus mechanism 1 and a reflected light source 5 into the pole gap of the electromagnetic debris deposition device 3 for on-line visual ferrograph. A reflection ferrogram is imaged directly other than though the oil film in the oil tunnel. The focus mechanism 1 is composed of a lens sleeve 10, a limit threaded sleeve 11, a focus threaded sleeve 14 and a connecting seat 2. An image sensor 13 is on the top of the focus mechanism 1 and a lens 12 is inside the lens sleeve 10. The focus mechanism 1 and reflected light source 5 are placed in the internal space of the electromagnetic debris deposition device 3, and the center optical axis of the focus mechanism 1 coincides with the center axis of the electromagnetic debris deposition device 3. The focus mechanism 1 and reflected light source 5 are fixed in the connecting seat 2, and the connecting seat 2 connects the focus mechanism 1 and the magnetic poles 3-1 together. A transmission light source 6 is a bi-color flat light source. Resolution and image contrast of ferrograms are improved by adjusting intensities of the reflected light source 5 and transmission light source 6.
机译:碎片直接反射嵌入式显微镜包括聚焦机构 1 和反射光源 5 进入电磁碎片沉积设备 3 的极隙中,用于在线视觉铁谱仪。反射铁谱图直接成像,而不是通过油道中的油膜成像。调焦机构 1 由镜筒 10 ,限位螺纹套筒 11 ,调焦螺纹套筒 14 组成>和连接座 2 。图像传感器 13 位于聚焦机构 1 的顶部,镜头 12 位于镜筒 10 。聚焦机构 1 和反射光源 5 放置在电磁碎屑沉积装置 3 的内部空间中,并且中心光轴聚焦机构 1 与电磁碎屑沉积装置 3 的中心轴重合。聚焦机构 1 和反射光源 5 固定在连接座 2 和连接座 2 中将聚焦机构 1 和磁极 3 - 1 连接在一起。透射光源 6 是双色平面光源。通过调整反射光源 5 和透射光源 6的强度,可以提高铁谱图的分辨率和图像对比度。

著录项

  • 公开/公告号US2018129029A1

    专利类型

  • 公开/公告日2018-05-10

    原文格式PDF

  • 申请/专利权人 XIAN JIAOTONG UNIVERSITY;

    申请/专利号US201715806232

  • 申请日2017-11-07

  • 分类号G02B21/02;G01N33/28;G01N15/06;G02B21;G02B21/06;G02B21/36;G06T7;

  • 国家 US

  • 入库时间 2022-08-21 13:00:42

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