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METHOD FOR MEASURING BASIS WEIGHT, METHOD FOR MANUFACTURING LAMINATED FILM, AND DEVICE FOR MEASURING BASIS WEIGHT

机译:基准重量的测定方法,层叠膜的制造方法以及基准重量的测定装置

摘要

To measure the mass per unit area of an applied layer in a layered film while preventing a measurement error from being caused by thickness unevenness, a per-unit-area-mass measuring device (30) includes a light projector (31a) configured to project light having a center wavelength of 405 nm, a light projector (31b) configured to project light having a center wavelength of 850 nm, light receivers (32a, 32b) configured to receive light having been transmitted through a separator (12), and a control section (33) configured to calculate the mass per unit area of a heat-resistant layer (4) on the basis of the respective transmitted-light intensities of the light having a center wavelength of 405 nm and the light having a center wavelength of 850 nm.
机译:为了在防止膜厚不均引起测量误差的同时,对层叠膜中的涂布层的每单位面积的质量进行测量,每单位面积质量测量装置( 30 )包括光投影仪( 31 a )被配置为投射中心波长为405 nm的光,投影仪( 31 b )配置为投射中心波长为850 nm的光,光接收器( 32 a, 32 b )配置为接收已透射过隔离膜( 12 )的光,控制部分( 33 )配置为计算耐热层每单位面积的质量( 4 )基于中心波长为405 nm的光和中心波长为850 nm的光的透射光强度。

著录项

  • 公开/公告号US2018172499A1

    专利类型

  • 公开/公告日2018-06-21

    原文格式PDF

  • 申请/专利权人 SUMITOMO CHEMICAL COMPANY LIMITED;

    申请/专利号US201615579991

  • 发明设计人 TAKAYUKI YAMANO;TAKAHIRO OKUGAWA;

    申请日2016-06-02

  • 分类号G01G9;G01G7/02;G06F17/11;G01N21/25;C23C26;

  • 国家 US

  • 入库时间 2022-08-21 13:00:38

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