Aparatus and method of determining a reaction sensitivity threshold of materials to elecrostatic discharge

摘要

A method and apparatus for determining the sensitivity to electrostatic discharge (ESD) of energetic and volatile samples. The method and apparatus include an optical detector configured to detect the optical light intensity from an ESD event with time resolution less than 15 microseconds. The optical light intensity is integrated to obtain an integrated light intensity. The method and apparatus further include processing circuitry configured to determine whether the ESD event is a “Go” event, wherein the energetic material undergoes decomposition generating additional light in addition to light generated by the ESD event itself, or the ESD event is a “No-Go” event without decomposition of the energetic/volatile material. The integrated light intensity threshold between “Go” and “No-Go” events is determined using a statistical distribution of inert sample measurements.