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Method of detecting most frequently accessed address of semiconductor memory based on probability information
Method of detecting most frequently accessed address of semiconductor memory based on probability information
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机译:基于概率信息的半导体存储器最常访问地址的检测方法
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摘要
A method of managing a semiconductor memory is provided which includes sampling a row address from an access stream on a memory cell array according to a sampling period; determining whether the sampled row address is an address corresponding to a target row which is most frequently accessed, based on probability information; and executing a refresh operation on rows adjacent to the target row.
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