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Rapid, non-destructive, selective infrared spectrometry analysis of organic coatings on molded articles
Rapid, non-destructive, selective infrared spectrometry analysis of organic coatings on molded articles
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机译：快速，无损，选择性红外光谱分析法对模塑制品上的有机涂层进行分析
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摘要
The invention is directed to a non-destructive method of detecting whether a coating or deposit (30, 34) of (a) SiOxCy or SiNxCy and/or (b) of SiOx is present on or near a surface of an article (12), such as a disposable thermoplastic medical article. The method includes impinging infrared light (216) having a wave number in at least a portion of a desired range onto at least a first surface being examined for the presence of the one or more coatings or deposits. At least a portion (224) of the infrared light impinged on the first surface is collected (at 222) and the response output, which may include for example the maximum intensity and/or peak area of the collected infrared light at an infrared spectroscopy peak, is used to indicate the presence of the one or more coatings or deposits.
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机译：本发明涉及一种检测（a）SiO x Cy或SiN x <的涂层或沉积物（ 30、34 ）的无损方法。 / Sub> C y 和/或（b）SiO x 存在于制品（ 12 ）的表面上或附近，例如作为一次性热塑性医疗制品。该方法包括将具有在期望范围的至少一部分中的波数的红外光（ 216 ）入射到至少一个被检查的一个或多个涂层或沉积物的存在的第一表面上。收集（在 222 处）入射在第一表面上的红外光的至少一部分（ 224 ）和响应输出，例如，可以包括最大强度和所收集的红外光在红外光谱峰处的峰面积用于指示一种或多种涂层或沉积物的存在。
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