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Method for correcting evolved gas analyzer and evolved gas analyzer

机译:析出气体分析仪的校正方法及析出气体分析仪

摘要

Disclosed herein is a method for correcting an evolved gas analyzer and the evolved gas analyzer. The method includes: correcting a mass spectrum position to be located at a reference spectrum position, the mass spectrum position corresponding to a mass-to-charge ratio m/z of a mass spectrum of a gas component of a reference sample; calculating a sensitivity correction factor Cs=Ss/S by using an area S and a reference area Ss of a chromatogram, the sensitivity correction factor being used to measure an area of a chromatogram of the gas component of a test sample; and calculating a heating correction factor H=t/ts by using a time t and a reference time is indicating a maximum peak of the chromatogram about the reference sample, the heating correction factor being used to correct a heating rate of the test sample when measuring the gas component of the test sample.
机译:本文公开了一种用于校正析出气体分析仪的方法和析出气体分析仪。该方法包括:将质谱图位置校正为位于参考谱图位置处,该质谱图位置对应于参考样品的气体成分的质谱的质荷比m / z。通过使用色谱图的面积S和参考面积Ss来计算灵敏度校正因子Cs = Ss / S,该灵敏度校正因子用于测量测试样品的气体成分的色谱图面积;并且通过使用时间t和参考时间来计算加热校正因子H = t / ts,该加热校正因子H = t / ts指示关于参考样品的色谱图的最大峰值,该加热校正因子用于在测量时校正测试样品的加热速率测试样品的气体成分。

著录项

  • 公开/公告号US9897579B2

    专利类型

  • 公开/公告日2018-02-20

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECH SCIENCE CORPORATION;

    申请/专利号US201615356585

  • 发明设计人 HIDEYUKI AKIYAMA;KANTARO MARUOKA;

    申请日2016-11-19

  • 分类号G01N27/62;G01N30/30;H01J37/08;G01N30/72;H01J49;H01J49/04;H01J49/10;G01N33;G01N30/04;

  • 国家 US

  • 入库时间 2022-08-21 12:56:40

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