Probe card and method for performing an unclamped inductive switching test using multiple equal-length interconnection lines emanating from a common connection node

摘要

A probe card with a ground contact, a first contact element and a second contact element is provided. The first contact element is coupled to an interconnection node via a first interconnection line having a definite length and the second contact element is coupled to the interconnection node via a second interconnection line having the same definite length. The interconnection node is directly connected to the ground contact.