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Clock-domain-crossing specific design mutations to model silicon behavior and measure verification robustness

机译:跨时钟域的特定设计突变,可对硅的行为进行建模并衡量验证的可靠性

摘要

Methods and apparatuses related to clock-domain-crossing (CDC) specific design mutations to model silicon behavior and measure verification robustness are described. CDC signal paths can be identified in a circuit design. Next, synchronization circuitry associated with the CDC signal paths can be identified. Design mutations can be added to the identified synchronization circuitry. The design mutations can then be used during functional verification to measure verification robustness of a circuit verification test suite.
机译:描述了与时钟跨域(CDC)特定设计突变相关的方法和装置,以模拟硅的行为并测量验证的可靠性。 CDC信号路径可以在电路设计中识别。接下来,可以识别与CDC信号路径相关的同步电路。可以将设计突变添加到已识别的同步电路中。然后,可以在功能验证期间使用设计突变,以测量电路验证测试套件的验证鲁棒性。

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