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Method for measuring performance parameters and detecting bad pixels of an infrared focal plane array module

机译:红外焦平面阵列模块的性能参数测量及不良像素检测方法

摘要

A method for measuring performance parameters of an infrared focal plane array (IRFPA) module has steps of capturing continuous digital images from the IRFPA module, performing image division on each of the continuous digital images, and measuring multiple performance parameters of each divided digital image, including signal transmission function, a temporal noise equivalent temperature difference, a spatial noise equivalent temperature difference, non-uniformity and operability, thereby increasing accuracy in measuring the performance parameters of the IRFPA module. Also, a method for detecting bad pixels of an IRFPA module includes a gain value method, an offset value method, a temporal noise method and a spatial noise method, is applicable to the IRFPA module with more than two response areas, and avoids incorrect detection to treat pixels in different response areas as bad pixels.
机译:一种用于测量红外焦平面阵列(IRFPA)模块的性能参数的方法,该方法包括以下步骤:从IRFPA模块捕获连续的数字图像;对每个连续的数字图像执行图像分割;以及测量每个分割的数字图像的多个性能参数,包括信号传输功能,时间噪声等效温度差,空间噪声等效温度差,不均匀性和可操作性,从而提高了测量IRFPA模块性能参数的准确性。而且,用于检测IRFPA模块的坏像素的方法包括增益值方法,偏移值方法,时间噪声方法和空间噪声方法,适用于具有两个以上响应区域的IRFPA模块,并且避免了错误检测。将不同响应区域中的像素视为坏像素。

著录项

  • 公开/公告号US9883178B2

    专利类型

  • 公开/公告日2018-01-30

    原文格式PDF

  • 申请/专利权人 UNLIMITED OPTICS CORP.;

    申请/专利号US201514736076

  • 发明设计人 YU-CHIAO CHIU;YIM-MIN CHEN;LE-YEN CHANG;

    申请日2015-06-10

  • 分类号H04N17/00;G06K9/62;G06T7/00;H04N5/33;H04N5/367;

  • 国家 US

  • 入库时间 2022-08-21 12:54:51

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