An apparatus and method of employing mutually exclusive write and read clocks in scan capture mode for testing digital interfaces. The apparatus includes a first circuit and a first clock generator configured to generate a first clock signal for transferring a test sample from an input to an output of the first circuit in response to the first clock signal during each of a first set of scan capture cycles; a second circuit and a second clock generator configured to generate a second clock signal for transferring the test sample from an input to an output of the second circuit in response to the second clock signal during each of a second set of scan capture cycle; the first clock signal being suppressed during each scan capture cycle of the second set, and the second clock signal being suppressed during each scan capture cycle of the first set.
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