TEMPERATURE-INDEPENDENT VERIFYING OF STRUCTURAL INTEGRITY OF MATERIALS USING ELECTRICAL PROPERTIES

摘要

The disclosure describes techniques for detecting a crack or defect in a material. The techniques may include determining, by a computing device (12), for each respective adjacent pair of electrodes of a plurality of electrodes (18A - 18L) electrically coupled to a material (16), a respective electrode pair voltage. The techniques also may include determining, by the computing device, for each respective adjacent pair of electrodes, a respective temperature-corrected electrode pair value based on the respective electrode pair voltage and at least one of a respective control voltage associated with the respective adjacent pair of electrodes or a temperature correction factor. The techniques further may include determining, by the computing device, whether the material includes a crack or defect based on the plurality of respective temperature-corrected electrode pair values.