APPARATUS FOR MEASURING UNIFORMITY OF CURVED PANEL AND METHOD FOR MEASURING UNIFORMITY OF CURVED PANEL

摘要

The present invention relates to an apparatus for measuring flatness of a curved panel capable of measuring uniformity of a transparent curved panel, and a method for measuring flatness of a curved panel. An apparatus for measuring uniformity of a curved panel according to an embodiment of the present invention comprises: a contact roller which contacts a transparent curved panel and runs along a curved surface of the curved panel; a geometry sensing camera which is located on the opposite side of a surface of the curved panel that contacts the contact roller, and captures contact geometry in which the contact roller contacts the curved panel; and a uniformity determination unit which measures the uniformity of the curved panel according to a change in the contact geometry on the basis of the contact geometry captured by the geometry sensing camera. Due to these features, it is possible to measure the curvature and uniformity of a curved panel relatively accurately and quickly and to reduce the manufacturing cost with a relatively simple configuration as well.