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a Apparatus and method for measuring the uniformity of curved panel

机译:用于测量弯曲面板的均匀性的设备和方法

摘要

The present invention relates to a device and a method for measuring uniformity of a surface panel for measuring uniformity of a transparent surface panel. The device for measuring the uniformity of the surface panel according to one embodiment of the present invention comprises: a contact roller which contacts with the transparent surface panel and drives along the curved surface of the surface panel; a shape detecting camera which is located in the opposite direction which comes in contact with the contact roller centered on the curved panel and captures a contact shape in which the contact roller contacts with the surface panel; and a uniformity judgment portion measuring the uniformity of the surface panel according to a change of the contact shape based on the contact shape captured by the shape detecting camera. Therefore, the curvature and uniformity of the surface panel can be measured relatively accurately and quickly, and manufacturing costs can be reduced with a relatively simple configuration.
机译:用于测量面板的均匀性的装置和方法技术领域本发明涉及一种用于测量面板的均匀性的装置和方法,该装置和方法用于测量透明面板的均匀性。根据本发明的一个实施方式的用于测量面板的均匀性的装置包括:接触辊,其与透明面板接触并且沿着面板的弯曲表面驱动;形状检测照相机位于相反方向,该形状检测照相机与以弯曲面板为中心的接触辊接触,并捕获接触辊与面板接触的接触形状。均匀性判定部根据由形状检测照相机拍摄到的接触形状,根据接触形状的变化来测定面板的均匀性。因此,可以相对准确和快速地测量面板的曲率和均匀性,并且可以通过相对简单的构造来降低制造成本。

著录项

  • 公开/公告号KR101834569B1

    专利类型

  • 公开/公告日2018-03-05

    原文格式PDF

  • 申请/专利权人 TOVIS CO. LTD.;

    申请/专利号KR20170042244

  • 申请日2017-03-31

  • 分类号G01B21/20;G01B11/255;H04N5/225;

  • 国家 KR

  • 入库时间 2022-08-21 12:38:19

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