首页> 外国专利> Spectrometer and Method for Measuring spectrum using the same

Spectrometer and Method for Measuring spectrum using the same

机译:光谱仪和使用该光谱仪的光谱测量方法

摘要

The present invention discloses a spectroscope including a first unit spectral filter which absorbs or reflects light of a partial wavelength band of an incident optical spectrum of an object, a second unit spectral filter which absorbs or reflects light of a wavelength band which is different from the partial wavelength band, a first photodetector for detecting a first optical spectrum passing through the first unit spectral filter, a second photodetector for detecting a second optical spectrum passing through the second unit spectral filter, and a processing unit for performing a reconstruction function of the incident optical spectrum of the object from the spectrum of the light detected by the first photodetector and the second photodetector. Accordingly, the present invention can easily perform 2D integration with a simple process at low costs.
机译:本发明公开了一种分光镜,其包括:第一单元光谱滤光器,其吸收或反射物体的入射光谱的部分波长带的光;第二单元光谱滤光器,其吸收或反射与物体的入射光谱不同的波长带的光。部分波长带,用于检测穿过第一单位光谱滤光片的第一光谱的第一光电检测器,用于检测穿过第二单位光谱滤光片的第二光谱的第二光电检测器和用于执行入射的重构功能的处理单元根据由第一光电检测器和第二光电检测器检测到的光的光谱,得出物体的光谱。因此,本发明可以以简单的过程以低成本容易地执行2D集成。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号