首页> 外国专利> MEMORY DEVICE AND ELECTRONIC DEVICE PERFORMING ADAPTIVE ERROR CORRECTION ACCORDING TO PRE-CHECKED ERROR RATE AND METHOD OF OPERATING MEMORY DEVICE

MEMORY DEVICE AND ELECTRONIC DEVICE PERFORMING ADAPTIVE ERROR CORRECTION ACCORDING TO PRE-CHECKED ERROR RATE AND METHOD OF OPERATING MEMORY DEVICE

机译:根据预先检查的错误率执行自适应错误校正的存储设备和电子设备以及操作该存储设备的方法

摘要

A memory device for performing error correction comprises a test vector generator generating a test vector to be written in a storage device; a data mismatch checker comparing read data read from the storage device with the test vector and generating an information signal corresponding to the difference between them; an error correction code controller performing error correction code encoding and decoding in accordance with any one of error correction code levels in response to a control signal inputted; and a memory controller controlling the test vector generator, the data mismatch checker, and the error correction code controller and transmitting a control signal corresponding to an error rate of the storage device to the error correction code controller in response to the information signal generated from the data mismatch checker.
机译:一种用于执行纠错的存储设备,包括:测试向量生成器,生成将被写入存储设备的测试向量;以及数据失配检查器将从存储设备读取的数据与测试向量进行比较,并生成与它们之间的差相对应的信息信号;纠错码控制器,响应于输入的控制信号,根据纠错码电平中的任何一个执行纠错码编码和解码;存储器控制器,其控制测试向量生成器,数据失配检查器和纠错码控制器,并且响应于从存储单元的错误率生成的信息信号,将与存储设备的错误率相对应的控制信号发送至纠错码控制器。数据不匹配检查器。

著录项

  • 公开/公告号KR20180086816A

    专利类型

  • 公开/公告日2018-08-01

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号KR20170010731

  • 发明设计人 KIM SOO JINKR;

    申请日2017-01-23

  • 分类号G06F11/10;

  • 国家 KR

  • 入库时间 2022-08-21 12:39:27

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